Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition

By: Material type: ArticleArticleDescription: 111-114 pSubject(s): In: Journal of Materials Research
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.18, No.01 (Jan. 2003) Available