Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition (Record no. 764658)
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000 -LEADER | |
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fixed length control field | 00564nab a2200145Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2003 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Gilmore Iii, Walter M |
9 (RLIN) | 812355 |
245 #0 - TITLE STATEMENT | |
Title | Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 111-114 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Growth Criterion |
9 (RLIN) | 677399 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Characterization Study |
9 (RLIN) | 806477 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Properties and Behavior |
9 (RLIN) | 744492 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2003 |
Title | Journal of Materials Research |
International Standard Serial Number | 08842914 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
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Engr Abul Kalam Library | Vol.18, No.01 (Jan. 2003) | 19/08/2023 | Articles |