Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition (Record no. 764658)

MARC details
000 -LEADER
fixed length control field 00564nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2003 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Gilmore Iii, Walter M
9 (RLIN) 812355
245 #0 - TITLE STATEMENT
Title Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition
300 ## - PHYSICAL DESCRIPTION
Extent 111-114 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Growth Criterion
9 (RLIN) 677399
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Characterization Study
9 (RLIN) 806477
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Properties and Behavior
9 (RLIN) 744492
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2003
Title Journal of Materials Research
International Standard Serial Number 08842914
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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  Engr Abul Kalam Library Vol.18, No.01 (Jan. 2003)   19/08/2023 Articles