Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition
Gilmore Iii, Walter M
Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition - 111-114 p.
Growth Criterion
Characterization Study
Properties and Behavior
Growth, Characterization, and Electrical Properties of Pbzr 0.52 Ti0.48 O3 Thin Films on Buffered Silicon Substrates Using Pulsed Laser Deposition - 111-114 p.
Growth Criterion
Characterization Study
Properties and Behavior