Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits

By: Material type: ArticleArticleDescription: 157-168 pSubject(s): In: Ieee Journal of Solid-State Circuits
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.39, No.01 (Jan. 2004) Available