Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits

Gyvez, Jose Pineda De Tuinhout, Hans P.

Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits - 157-168 p.


Leakage Currents
Mismatch
Subthreshold Logic