Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits (Record no. 757346)
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000 -LEADER | |
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fixed length control field | 00529nab a2200157Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2004 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Gyvez, Jose Pineda De |
9 (RLIN) | 802753 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Tuinhout, Hans P. |
9 (RLIN) | 802754 |
245 #0 - TITLE STATEMENT | |
Title | Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 157-168 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Leakage Currents |
9 (RLIN) | 757109 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mismatch |
9 (RLIN) | 730582 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Subthreshold Logic |
9 (RLIN) | 765066 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2004 |
Title | Ieee Journal of Solid-State Circuits |
International Standard Serial Number | 00189200 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.39, No.01 (Jan. 2004) | 19/08/2023 | Articles |