Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits (Record no. 757346)

MARC details
000 -LEADER
fixed length control field 00529nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2004 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Gyvez, Jose Pineda De
9 (RLIN) 802753
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Tuinhout, Hans P.
9 (RLIN) 802754
245 #0 - TITLE STATEMENT
Title Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits
300 ## - PHYSICAL DESCRIPTION
Extent 157-168 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Leakage Currents
9 (RLIN) 757109
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mismatch
9 (RLIN) 730582
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Subthreshold Logic
9 (RLIN) 765066
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2004
Title Ieee Journal of Solid-State Circuits
International Standard Serial Number 00189200
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.39, No.01 (Jan. 2004)   19/08/2023 Articles