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A Study of Stress-Induced P+/N Salicided Junction Leakage Failure and Optimized Process Conditions for Sub-0.15-Um Cmos Technology

Lee, J. -S.

A Study of Stress-Induced P+/N Salicided Junction Leakage Failure and Optimized Process Conditions for Sub-0.15-Um Cmos Technology - 1985-1992 p.

Subjects--Topical Terms:
Parkdale Develop Designer Fiber
Young'S Modulus

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