A Closed- Form Back-Gate-Bias Related Inverse Narrow-Channel Effect Model for Deep-Submicron Vlsi Cmos Devices Using Shaliow Trench Isolation
lin, Shih-Chieh Kuo, James B. Sun, Shih-Wei
A Closed- Form Back-Gate-Bias Related Inverse Narrow-Channel Effect Model for Deep-Submicron Vlsi Cmos Devices Using Shaliow Trench Isolation - 725-733 p.
Sti
Con Formal Mapping
Inverse Narrowchannel Effect
A Closed- Form Back-Gate-Bias Related Inverse Narrow-Channel Effect Model for Deep-Submicron Vlsi Cmos Devices Using Shaliow Trench Isolation - 725-733 p.
Sti
Con Formal Mapping
Inverse Narrowchannel Effect