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		New Aspects and Mechanism of Kink Effect in Static Back-Gate Transconductance Characteristics in Fuliy-Depleted Soi Mosfet'S on High-Dose Simox Wafers by Ushiki, Takeo Kotani, Koji Funaki, Toshihiko Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fuliy-Depleted Soi Cmos for Analog Applications by Colinge, Jean-Pierre Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Accurate Soi Mosfet Characterization at Microwave Frequencies for Device Performance Optimization and Analog Modeling by Colinge, Jean-Pierre Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analysis of Delay Time Instability According ToOperatIIng Frequency in Field Shield Isolated Soi Corcuits by Maeda, Shigenobu Yamaguchi, Y Ueda, Kimio Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Investigation of a Multigigahertz Mosfet Amplifier with an on-Chip Inductor Fabricated on a Simox Wafer by Harada, Mitsuru Yamaguchi, Chikara Tsuchiya, Toshiaki Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		SuppressingParasitic Bipolar Action in Fuliy-Depleted Mosfet''S/Simox by Using Back-Side Bias-Temperature Treatment by Koizumi, H Tsuchiya, Toshiaki Shimaya, Maskazu Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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