New Aspects and Mechanism of Kink Effect in Static Back-Gate Transconductance Characteristics in Fuliy-Depleted Soi Mosfet'S on High-Dose Simox Wafers

By: Material type: ArticleArticleDescription: 360-366 pSubject(s): In: IEEE Transactions on Electron Devices
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Articles Articles Periodical Section Vol.47, No.02 (Feb. 2000) Available