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		A Study of Interface Trap Generation by Fowler-Nordheim and Substrate-Hot-Carrier Stresses Fo 4-Nm Thick Gate Oxides by Shiue, Jao-Hsian Lee, Joseph Ya-Min Chao, Tien-Sheng Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Impact of Interface Traps on Gate-Induced Drain Leakage Current in N-Type Metal Oxide Semiconductor Field Effect Transistor by touhami, A Bouhdada, A Source: International Journal of Electronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Determination of Interface and Bulk Traps InSubthreshold Region of Polycrystalline Silicon Thin-Film Transistors by Hastas, N A Tassis, D H Kamarinos, G Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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