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Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic Performance Test Using Rtds Test-Bed by
  • Kang, Hae-Gweon
  • Song, Un-Sig
  • Kim, Jin-Ho
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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D-Q Equivalent Circuit-Based Protection Algorithm for a Doubly-Fed Induction Generator InTime Domain by
  • Kang, Yong-Cheol
  • Kang, Hae-Gweon
  • Lee, Ji-Hoon
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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