Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic Performance Test Using Rtds Test-Bed

By: Material type: ArticleArticleDescription: 1104-1111 pSubject(s): In: Journal of Electrical Engineering and Technology
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.09, No.03 (May. 2014) Available