Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic Performance Test Using Rtds Test-Bed (Record no. 712170)

MARC details
000 -LEADER
fixed length control field 00628nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2014 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kang, Hae-Gweon
9 (RLIN) 707108
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Song, Un-Sig
9 (RLIN) 707109
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kim, Jin-Ho
9 (RLIN) 707110
245 #0 - TITLE STATEMENT
Title Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic Performance Test Using Rtds Test-Bed
300 ## - PHYSICAL DESCRIPTION
Extent 1104-1111 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Ied
9 (RLIN) 707111
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Real Time
9 (RLIN) 693684
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Over Current Relay
9 (RLIN) 707112
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2014
Title Journal of Electrical Engineering and Technology
International Standard Serial Number 19750102
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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  Engr Abul Kalam Library Vol.09, No.03 (May. 2014)   19/08/2023 Articles