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A Study of Stress-Induced P+/N Salicided Junction Leakage Failure and Optimized Process Conditions for Sub-0.15-Um Cmos Technology by
  • Lee, J. -S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Predicted Effects of Shunt Injection onRotordynamics of Gas Labyrinth Seals by
  • Kim, A
Source: Transactions ofAsme, Journal of Engineering for Gas Turbines and Power
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Wellman, Parkdale Develop Designer Fiber Sensura by
  • Miller, Hannah
Source: International Fiber Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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