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		Fundamental limits to Power Consumption of Lc Subthreshold Osciliators by Pascoli, Di S Source: IET:Iee: Electronics Letters Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Threshold Voltage Mismatch and Intre-Die Leakage Current in Digital Cmos Circuits by Gyvez, Jose Pineda De Tuinhout, Hans P Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Robust Subthreshold Logic for Ultra-Low Power Operation by Soeleman, H Paul, B. C Roy, K Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Linear Cofactor Difference Method of Mosfet Subthreshold Characteristics for Extracting Interface Traps Induced By Gate Oxide Stress Test by He, J. H Huang, R Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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