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		Low-Frequency Noise in Deep -Submicron Metal-Oxide-Semiconductor Field-Effect Transistor by Butler, C Source: Iee Proceedings:Circuits, Devices and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Object-Oriented Model of Measurement System. by Yang, Q Butler, C Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Filter Optic Sensor for Measurement of Surface Roughness and Displacement Using Artificial Neural Networks. by Zhang, P Butler, C Yang, Q Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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