Low-Frequency Noise in Deep -Submicron Metal-Oxide-Semiconductor Field-Effect Transistor

By: Material type: ArticleArticleDescription: 23-32 pSubject(s): In: Iee Proceedings:Circuits, Devices and Systems
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.149, No.01 (Feb. 2002) Available