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		Analysis of Enhanced Hot-Carrier Effects in Scaled Flash Memory Devices by Chen, Chun-Chi liu, Zhi-Zheng Ma, T-P Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Making Silicon Nitride Film a Viable Gate Dielectric by Ma, T.P Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Direct Lateral Profiling of Hot-Carrier-Induced Oxide Charge and Interface Traps in Thin Gate Mosfet'S by Chen, Chun Ma, T.P Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Gate Dielectrics for Si, Sic, and Gan As Synthesized By Jet Vapor Deposition by Ma, T.P Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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