A New Technique for Hot Carrier Reliability Evaluations of Flash Memory Celi After Long-Term Program/Erase Cycles

By: Material type: ArticleArticleDescription: 1883-1889 pSubject(s): In: IEEE Transactions on Electron Devices
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.46, No.09 (Sep. 1999) Available