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A New Technique for Hot Carrier Reliability Evaluations of Flash Memory Celi After Long-Term Program/Erase Cycles

Chung, S.T. Yih, Cherng-Ming liang, Mong-Song

A New Technique for Hot Carrier Reliability Evaluations of Flash Memory Celi After Long-Term Program/Erase Cycles - 1883-1889 p.

Subjects--Topical Terms:
Flash Memory
Hot Carrier

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