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Low-Frequency Noise in Thick-Film Resistors Due to Two-Step Tunneling Process in Insulator Layer Elemental Mim Celi by
  • Jevtic, Milan N
  • Stanimirovic, Zdravko
  • Mrak, Ivanka
Source: IEEE Transactions on Components and Packaging Technologies
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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An Alternative Method for Transistor Low Frequency Noise Estimation By Measuring Phase Noise of Test Oscillator by
  • Jevtic, Milan N
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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