Low-Frequency Noise in Thick-Film Resistors Due to Two-Step Tunneling Process in Insulator Layer Elemental Mim Celi

By: Material type: ArticleArticleDescription: 120-125 pSubject(s): In: IEEE Transactions on Components and Packaging Technologies
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.22, No.01 (Mar. 1999) Available