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Low-Frequency Noise in Thick-Film Resistors Due to Two-Step Tunneling Process in Insulator Layer Elemental Mim Celi

Jevtic, Milan N. Stanimirovic, Zdravko Mrak, Ivanka

Low-Frequency Noise in Thick-Film Resistors Due to Two-Step Tunneling Process in Insulator Layer Elemental Mim Celi - 120-125 p.

Subjects--Topical Terms:
Low-Frequency
Two-Step Process
Trap

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