Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 828347

003 - CONTROL NUMBER IDENTIFIER

• control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20230820075059.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 230820|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: NEDUET
• Transcribing agency: NEDUET

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Pd/Soi (Partially Depleted Silicion -Insulator Technology)

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (NEDUET)776929: Hwang, W. 813108, Performance Analysis of Tapered Gate in Pd/Soi Cmos Technology.