Multiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits (Record no. 777062)

MARC details
000 -LEADER
fixed length control field 00548nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Nicolici, N
9 (RLIN) 822384
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Al-Hashimi, B M
9 (RLIN) 793492
245 #0 - TITLE STATEMENT
Title Multiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits
300 ## - PHYSICAL DESCRIPTION
Extent 721-734 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scan-During-Sustaion(Sds)Method.
9 (RLIN) 828500
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Chain and Design Process
9 (RLIN) 828501
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Prototyping
9 (RLIN) 755037
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title IEEE TransactionsonComputers
International Standard Serial Number 00189340
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
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  Engr Abul Kalam Library Vol.51, No.06 (Jun. 2002)   20/08/2023 Articles