Multiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits
Nicolici, N Al-Hashimi, B M
Multiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits - 721-734 p.
Scan-During-Sustaion(Sds)Method.
Chain and Design Process
Prototyping
Multiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits - 721-734 p.
Scan-During-Sustaion(Sds)Method.
Chain and Design Process
Prototyping