Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test (Record no. 774270)

MARC details
000 -LEADER
fixed length control field 00524nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Venuto, D. De
9 (RLIN) 810603
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kayal, M.
9 (RLIN) 824221
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ohletz, M.J.
9 (RLIN) 810604
245 #0 - TITLE STATEMENT
Title Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test
300 ## - PHYSICAL DESCRIPTION
Extent 387-398 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Quiescent Current
9 (RLIN) 778653
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Silicon Wafer
9 (RLIN) 779514
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Kink-Effect
9 (RLIN) 777266
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Microelectronics Journal
International Standard Serial Number 00262692
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.33, No.5-6 (May. 2002)   19/08/2023 Articles