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Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test

Venuto, D. De Kayal, M. Ohletz, M.J.

Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test - 387-398 p.

Subjects--Topical Terms:
Quiescent Current
Silicon Wafer
Kink-Effect

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