Characterization of Interface Degradation in Deep Submicronmosfets By Gate Controlled -Diode Measurement (Record no. 771066)

MARC details
000 -LEADER
fixed length control field 00542nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Huang, J.-T
9 (RLIN) 815117
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chen, T.P.
9 (RLIN) 777744
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Tse, M.S.
9 (RLIN) 808387
245 #0 - TITLE STATEMENT
Title Characterization of Interface Degradation in Deep Submicronmosfets By Gate Controlled -Diode Measurement
300 ## - PHYSICAL DESCRIPTION
Extent 639-644 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mosfets
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Gate-Controlled -Diode
9 (RLIN) 820031
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Fowler
9 (RLIN) 779681
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Microelectronics Journal
International Standard Serial Number 00262692
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.33, No.08 (Aug. 2002)   19/08/2023 Articles