Characterization of Interface Degradation in Deep Submicronmosfets By Gate Controlled -Diode Measurement (Record no. 771066)
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000 -LEADER | |
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fixed length control field | 00542nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2002 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Huang, J.-T |
9 (RLIN) | 815117 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Chen, T.P. |
9 (RLIN) | 777744 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Tse, M.S. |
9 (RLIN) | 808387 |
245 #0 - TITLE STATEMENT | |
Title | Characterization of Interface Degradation in Deep Submicronmosfets By Gate Controlled -Diode Measurement |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 639-644 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mosfets |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Gate-Controlled -Diode |
9 (RLIN) | 820031 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Fowler |
9 (RLIN) | 779681 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2002 |
Title | Microelectronics Journal |
International Standard Serial Number | 00262692 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
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Engr Abul Kalam Library | Vol.33, No.08 (Aug. 2002) | 19/08/2023 | Articles |