Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity (Record no. 761455)
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000 -LEADER | |
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fixed length control field | 00537nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2003 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Morvan, Erwan |
9 (RLIN) | 808416 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Sghaier, Nabil |
9 (RLIN) | 808417 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Souifi, Abdelkader |
9 (RLIN) | 808418 |
245 #0 - TITLE STATEMENT | |
Title | Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 297-302 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Htcvd |
9 (RLIN) | 808420 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Trapping |
9 (RLIN) | 707309 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mesfets |
9 (RLIN) | 777036 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2003 |
Title | Ieee Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.50, No.02 (Feb. 2003) | 19/08/2023 | Articles |