Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity (Record no. 761455)

MARC details
000 -LEADER
fixed length control field 00537nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2003 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Morvan, Erwan
9 (RLIN) 808416
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Sghaier, Nabil
9 (RLIN) 808417
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Souifi, Abdelkader
9 (RLIN) 808418
245 #0 - TITLE STATEMENT
Title Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity
300 ## - PHYSICAL DESCRIPTION
Extent 297-302 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Htcvd
9 (RLIN) 808420
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Trapping
9 (RLIN) 707309
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mesfets
9 (RLIN) 777036
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2003
Title Ieee Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.50, No.02 (Feb. 2003)   19/08/2023 Articles