Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity
Morvan, Erwan Sghaier, Nabil Souifi, Abdelkader
Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity - 297-302 p.
Htcvd
Trapping
Mesfets
Study of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity - 297-302 p.
Htcvd
Trapping
Mesfets