Electrical Test Strategies for A Wafer-Level Packaging Technology (Record no. 758256)

MARC details
000 -LEADER
fixed length control field 00587nab a2200181Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2003 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Keezer, David C.
9 (RLIN) 804250
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Patel, Chirag S.
9 (RLIN) 804251
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Bakir, Muhannad S.
9 (RLIN) 315006
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhou, Qing
9 (RLIN) 804252
245 #0 - TITLE STATEMENT
Title Electrical Test Strategies for A Wafer-Level Packaging Technology
300 ## - PHYSICAL DESCRIPTION
Extent 267-272 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Interconnections
9 (RLIN) 768433
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Packaging
9 (RLIN) 94109
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Testing
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2003
Title Ieee Transactions onElectronics Packaging Manufacturing
International Standard Serial Number 1523334X
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.26, No.04 (Oct. 2003)   19/08/2023 Articles