Thermally Robust Hfn Metal As A Promising Gate Electrode for Advanced Mos Device Applications (Record no. 757264)
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000 -LEADER | |
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fixed length control field | 00510nab a2200157Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2004 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Yu Yu, Hong |
9 (RLIN) | 802608 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Li, Ming-Fu |
9 (RLIN) | 331582 |
245 #0 - TITLE STATEMENT | |
Title | Thermally Robust Hfn Metal As A Promising Gate Electrode for Advanced Mos Device Applications |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 609-615 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Cmos Device |
9 (RLIN) | 801110 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Hfn |
9 (RLIN) | 802609 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Metal Gate |
9 (RLIN) | 800730 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2004 |
Title | Ieee Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.51, No.04 (Apr. 2004) | 19/08/2023 | Articles |