Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon (Record no. 745508)

MARC details
000 -LEADER
fixed length control field 00587nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kolodzey, James
9 (RLIN) 268157
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chen, Shong-Chin
9 (RLIN) 781124
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Olowolafe, Johnson Olufemi
9 (RLIN) 781125
245 #0 - TITLE STATEMENT
Title Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon
300 ## - PHYSICAL DESCRIPTION
Extent 121-128 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Dielectric Breakdown
9 (RLIN) 742641
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductor Dbr
9 (RLIN) 781126
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mos Capacitor
9 (RLIN) 769357
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.47, No.01 (Jan. 2000)   19/08/2023 Articles