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Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon

Kolodzey, James Chen, Shong-Chin Olowolafe, Johnson Olufemi

Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon - 121-128 p.

Subjects--Topical Terms:
Dielectric Breakdown
Semiconductor Dbr
Mos Capacitor

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