onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes (Record no. 745460)

MARC details
000 -LEADER
fixed length control field 00595nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1999 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Isaacson, Michael
9 (RLIN) 305572
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Betta, R. A. Dalia
9 (RLIN) 780991
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Soncini, G.
9 (RLIN) 780992
245 #0 - TITLE STATEMENT
Title onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes
300 ## - PHYSICAL DESCRIPTION
Extent 817-819 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Gated Diode
9 (RLIN) 757974
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Generation lifetime
9 (RLIN) 780993
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element High-Reliability Organizations
9 (RLIN) 719471
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1999
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.46, No.04 (Apr. 1999)   19/08/2023 Articles