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onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes

Isaacson, Michael Betta, R. A. Dalia Soncini, G.

onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes - 817-819 p.

Subjects--Topical Terms:
Gated Diode
Generation lifetime
High-Reliability Organizations

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