A Novel Single-Device Dc Method for Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S (Record no. 745125)
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000 -LEADER | |
---|---|
fixed length control field | 00670nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s1998 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Lou, Choon-Leong |
9 (RLIN) | 780235 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Chin, Wai-Kin |
9 (RLIN) | 780236 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Pan, Yang |
9 (RLIN) | 780238 |
245 #2 - TITLE STATEMENT | |
Title | A Novel Single-Device Dc Method for Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1317-1323 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Hot Carrier |
9 (RLIN) | 767189 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mobility |
9 (RLIN) | 164527 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mosfet |
9 (RLIN) | 720139 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 1998 |
Title | IEEE Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.45, No.06 (Jun. 1998) | 19/08/2023 | Articles |