A Novel Single-Device Dc Method for Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S (Record no. 745125)

MARC details
000 -LEADER
fixed length control field 00670nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lou, Choon-Leong
9 (RLIN) 780235
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chin, Wai-Kin
9 (RLIN) 780236
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Pan, Yang
9 (RLIN) 780238
245 #2 - TITLE STATEMENT
Title A Novel Single-Device Dc Method for Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S
300 ## - PHYSICAL DESCRIPTION
Extent 1317-1323 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Hot Carrier
9 (RLIN) 767189
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mobility
9 (RLIN) 164527
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mosfet
9 (RLIN) 720139
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.06 (Jun. 1998)   19/08/2023 Articles