Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films (Record no. 745005)

MARC details
000 -LEADER
fixed length control field 00556nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ricco, Bruno
9 (RLIN) 768878
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Gozzi, Gianfranco
9 (RLIN) 779948
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lanzoni, Nassimo
9 (RLIN) 779950
245 #0 - TITLE STATEMENT
Title Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films
300 ## - PHYSICAL DESCRIPTION
Extent 1554-1560 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mos Capacitors
9 (RLIN) 777962
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Reliability
9 (RLIN) 53955
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thin Oxide
9 (RLIN) 771943
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.07 (Jul. 1998)   19/08/2023 Articles