Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films (Record no. 745005)
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000 -LEADER | |
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fixed length control field | 00556nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s1998 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Ricco, Bruno |
9 (RLIN) | 768878 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Gozzi, Gianfranco |
9 (RLIN) | 779948 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Lanzoni, Nassimo |
9 (RLIN) | 779950 |
245 #0 - TITLE STATEMENT | |
Title | Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1554-1560 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mos Capacitors |
9 (RLIN) | 777962 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Reliability |
9 (RLIN) | 53955 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Thin Oxide |
9 (RLIN) | 771943 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 1998 |
Title | IEEE Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
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Engr Abul Kalam Library | Vol.45, No.07 (Jul. 1998) | 19/08/2023 | Articles |