Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films
Ricco, Bruno Gozzi, Gianfranco Lanzoni, Nassimo
Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films - 1554-1560 p.
Mos Capacitors
Reliability
Thin Oxide
Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films - 1554-1560 p.
Mos Capacitors
Reliability
Thin Oxide