A Study of Interface Trap Generation by Fowler-Nordheim and Substrate-Hot-Carrier Stresses Fo 4-Nm Thick Gate Oxides (Record no. 744910)
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000 -LEADER | |
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fixed length control field | 00598nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s1999 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Shiue, Jao-Hsian |
9 (RLIN) | 776325 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Lee, Joseph Ya-Min |
9 (RLIN) | 779740 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Chao, Tien-Sheng |
9 (RLIN) | 779742 |
245 #2 - TITLE STATEMENT | |
Title | A Study of Interface Trap Generation by Fowler-Nordheim and Substrate-Hot-Carrier Stresses Fo 4-Nm Thick Gate Oxides |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1705-1710 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Hot Carrier |
9 (RLIN) | 767189 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Interface Traps |
9 (RLIN) | 779743 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mos Device |
9 (RLIN) | 768494 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 1999 |
Title | IEEE Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.46, No.08 (Aug. 1999) | 19/08/2023 | Articles |