Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique (Record no. 744607)

MARC details
000 -LEADER
fixed length control field 00549nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Wang, Tahui
9 (RLIN) 777572
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chang, Tse-En
9 (RLIN) 779059
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Bess, Vicki
9 (RLIN) 779060
245 #0 - TITLE STATEMENT
Title Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique
300 ## - PHYSICAL DESCRIPTION
Extent 1511-1517 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Gild
9 (RLIN) 779062
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Hot Carrier
9 (RLIN) 767189
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Oxide
9 (RLIN) 83600
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.07 (Jul. 1998)   19/08/2023 Articles