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Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique

Wang, Tahui Chang, Tse-En Bess, Vicki

Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique - 1511-1517 p.

Subjects--Topical Terms:
Gild
Hot Carrier
Oxide

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