Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation (Record no. 741688)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 00546nab a2200169Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2000 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | ling, Chi-Hai |
9 (RLIN) | 771937 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Ang, C H |
9 (RLIN) | 771939 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Ang, D. S. |
9 (RLIN) | 771940 |
245 #0 - TITLE STATEMENT | |
Title | Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 650-652 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Leakage Currents |
9 (RLIN) | 757109 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mos |
9 (RLIN) | 758952 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Thin Oxide |
9 (RLIN) | 771943 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2000 |
Title | IEEE Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.47, No.03 (Mar. 2000) | 19/08/2023 | Articles |