Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation (Record no. 741688)

MARC details
000 -LEADER
fixed length control field 00546nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name ling, Chi-Hai
9 (RLIN) 771937
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ang, C H
9 (RLIN) 771939
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ang, D. S.
9 (RLIN) 771940
245 #0 - TITLE STATEMENT
Title Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation
300 ## - PHYSICAL DESCRIPTION
Extent 650-652 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Leakage Currents
9 (RLIN) 757109
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mos
9 (RLIN) 758952
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thin Oxide
9 (RLIN) 771943
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
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