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Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation

ling, Chi-Hai Ang, C H Ang, D. S.

Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation - 650-652 p.

Subjects--Topical Terms:
Leakage Currents
Mos
Thin Oxide

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