Planarized Multilevel Interconnection Using Chemical Mechanical Polishing of Selective Cvd-Ai Via Plugs

Amazawa, Takao Arita, Yoshinobu Yamamoto, EIIchi

Planarized Multilevel Interconnection Using Chemical Mechanical Polishing of Selective Cvd-Ai Via Plugs - 815-820 p.


Aluminum Integrated Circuit Conductors
Electromigration
Cmp