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Characterization of Various Stress-Induced Oxide Traps in Mosfet'S by Using a Subthreshold Transient Current Technique

Wang, Tahui Ching, Lu-Ping Huang, Chimoon

Characterization of Various Stress-Induced Oxide Traps in Mosfet'S by Using a Subthreshold Transient Current Technique - 1791-1796 p.

Subjects--Topical Terms:
Characte Regognition
Various Implant Types

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