Dependence of Fermi Level Positions at Gate and Substrate onReliability of Ultrathin Mos Gate Oxides
Yang, Tien-Chun Sachdev, Pinkesh SARaswat, Krishna C.
Dependence of Fermi Level Positions at Gate and Substrate onReliability of Ultrathin Mos Gate Oxides - 1457-1463 p.
Barrier Height
Ultrathin Sections
Oxide
Dependence of Fermi Level Positions at Gate and Substrate onReliability of Ultrathin Mos Gate Oxides - 1457-1463 p.
Barrier Height
Ultrathin Sections
Oxide