A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S
Wang, Tahui Chiang, Lu-Ping Zous, Nian-Kai
A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S - 1877-1882 p.
Drain Leakge Degradation
Hot Carrier
Thin Oxide
A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S - 1877-1882 p.
Drain Leakge Degradation
Hot Carrier
Thin Oxide